Characterization of size-selected metal clusters implanted below the surface of graphite
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Colleges, School and Institutes
We have investigated the outcome of energetic implantation of size-selected metal cluster ions below the surface of graphite. Pt-4(-) clusters were implanted to a prescribed depth of 3 monolayers established by scanning tunneling microscopy of etched cluster tracks. The subsurface individual clusters were imaged directly by annular dark-field imaging in a scanning transmission electron microscope. The results show that the constituent atoms of the implanted clusters remain spatially correlated to within 5 Angstrom. (C) 2003 American Institute of Physics.
|Number of pages||4|
|Journal||Journal of Applied Physics|
|Publication status||Published - 1 Jan 2003|