Characterization of size-selected metal clusters implanted below the surface of graphite

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We have investigated the outcome of energetic implantation of size-selected metal cluster ions below the surface of graphite. Pt-4(-) clusters were implanted to a prescribed depth of 3 monolayers established by scanning tunneling microscopy of etched cluster tracks. The subsurface individual clusters were imaged directly by annular dark-field imaging in a scanning transmission electron microscope. The results show that the constituent atoms of the implanted clusters remain spatially correlated to within 5 Angstrom. (C) 2003 American Institute of Physics.


Original languageEnglish
Pages (from-to)4820-4823
Number of pages4
JournalJournal of Applied Physics
Issue number8
Publication statusPublished - 1 Jan 2003