Applications and systematic errors of X-ray computed tomography associated with dimensional metrology

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Authors

  • Wenjuan Sun
  • Stephen Brown
  • Peter Woolliams
  • Michael McCarthy
  • Jan White

Colleges, School and Institutes

External organisations

  • National Physical Laboratory

Abstract

X-ray computed tomography (XCT) is increasingly being used in many industrial quality control applications due to its ability to visualise in three dimensions both the external and internal structure of parts and to detect defects without contact or damage to that part. XCT technology also has the potential to deliver critical dimensional measurements at the micrometre level. However, the quality of these measurements can be limited by a number of systematic errors associated with the technology, for example, beam hardening and cone beam effects. In this paper, beam hardening and cone beam errors associated with the cone beam XCT are described together with their impact on typical dimensional measurements.

Details

Original languageEnglish
Title of host publication55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016
Publication statusPublished - 2016
Event55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016 - Nottingham, United Kingdom
Duration: 12 Sep 201614 Sep 2016

Conference

Conference55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016
CountryUnited Kingdom
CityNottingham
Period12/09/1614/09/16