Application of optical single-sideband laser in Raman atom interferometry

Michael Holynski; Kai Bongs; Lingxiao Zhu; Clemens Rammeloo; Yu-Hung Lien; Alexander Niggebaum; Andrew Hinton

doi:10.1364/OE.26.006542

Application of optical single-sideband laser in Raman atom interferometry

Michael Holynski, Kai Bongs, Lingxiao Zhu, Clemens Rammeloo, Yu-Hung Lien, Alexander Niggebaum, Andrew Hinton

Physics and Astronomy

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Abstract

A frequency doubled I/Q modulator based optical single-sideband (OSSB) laser system is demonstrated for atomic physics research, specifically for atom interferometry where the presence of additional sidebands causes parasitic transitions. The performance of the OSSB technique and the spectrum after second harmonic generation are measured and analyzed. The additional sidebands are removed with better than 20 dB suppression, and the influence of parasitic transitions upon
stimulated Raman transitions at varying spatial positions is shown to be removed beneath experimental noise. This technique will facilitate the development of compact atom interferometry based sensors with improved accuracy and reduced complexity.

Original language	English
Pages (from-to)	6542-6553
Journal	Optics Express
Volume	26
Issue number	6
DOIs	https://doi.org/10.1364/OE.26.006542
Publication status	Published - 19 Mar 2018

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AU - Holynski, Michael

AU - Bongs, Kai

AU - Zhu, Lingxiao

AU - Rammeloo, Clemens

AU - Lien, Yu-Hung

AU - Niggebaum, Alexander

AU - Hinton, Andrew

PY - 2018/3/19

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AB - A frequency doubled I/Q modulator based optical single-sideband (OSSB) laser system is demonstrated for atomic physics research, specifically for atom interferometry where the presence of additional sidebands causes parasitic transitions. The performance of the OSSB technique and the spectrum after second harmonic generation are measured and analyzed. The additional sidebands are removed with better than 20 dB suppression, and the influence of parasitic transitions upon stimulated Raman transitions at varying spatial positions is shown to be removed beneath experimental noise. This technique will facilitate the development of compact atom interferometry based sensors with improved accuracy and reduced complexity.

U2 - 10.1364/OE.26.006542

DO - 10.1364/OE.26.006542

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JO - Optics Express

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Application of optical single-sideband laser in Raman atom interferometry

Abstract

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