A study of dislocation transmission through a grain boundary in hcp Ti-6Al using micro-cantilevers

Rengen Ding, Jicheng Gong, Angus Wilkinson, Ian Jones

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)
1 Downloads (Pure)

Abstract

Micro-cantilevers with an equilateral triangular cross-section and an apex at the bottom were machined across grain boundaries in a Ti–6Al alloy sample using a focused ion beam (FIB). A nano-indenter was used to deform the micro-cantilevers. An <a> prism slip system was selectively activated in the upper grain by controlling the crystal orientation along the micro-cantilever. Specimens for transmission electron microscopy (TEM) were prepared from the deformed micro-cantilevers using dual-beam FIB. Bright field scanning transmission electron microscopy was used to investigate the process of slip propagation through the grain boundary.
Original languageEnglish
Pages (from-to)416-423
Number of pages8
JournalActa Materialia
Volume103
Early online date6 Nov 2015
DOIs
Publication statusPublished - 15 Jan 2016

Fingerprint

Dive into the research topics of 'A study of dislocation transmission through a grain boundary in hcp Ti-6Al using micro-cantilevers'. Together they form a unique fingerprint.

Cite this