A near-field scanning microwave microscope for measurement of the permittivity and loss of high-loss materials

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Authors

  • A. P. Gregory
  • J. F. Blackburn
  • K. Lees
  • R. N. Clarke
  • T. E. Hodgetts
  • N. Klein

Colleges, School and Institutes

External organisations

  • National Physical Laboratory
  • Consultant to NPL
  • Imperial College London

Abstract

The design and calibration of a Near-Field Scanning Microwave Microscope (NSMM) for measurement of permittivity and loss on the small scale are described. The instrument described uses a wire probe that is electromagnetically coupled to a resonant cavity. Using an electrostatic model based on image charges (Gao and Xiang 1998) permittivity and loss may be determined. The paper describes progress in two specific areas: (i) The implementation of an optical beam-deflection method for obtaining contact mode between the probe tip and specimens. (ii) Improvements to the calibration process to improve the traceability and accuracy of the measurement of loss by using the Laplacian 'complex frequency' in the image-charge model. This is demonstrated by measurements on polar liquids.

Details

Original languageEnglish
Title of host publication84th ARFTG Microwave Measurement Conference
Subtitle of host publicationThe New Frontiers for Microwave Measurements, ARFTG 2014
Publication statusPublished - 16 Jan 2014
Event84th ARFTG Microwave Measurement Conference, ARFTG 2014 - Boulder, United States
Duration: 4 Dec 20145 Dec 2014

Publication series

Name84th ARFTG Microwave Measurement Conference: The New Frontiers for Microwave Measurements, ARFTG 2014

Conference

Conference84th ARFTG Microwave Measurement Conference, ARFTG 2014
CountryUnited States
CityBoulder
Period4/12/145/12/14

Keywords

  • complex frequency, Dielectric measurement, microwave microscope

ASJC Scopus subject areas