A multi-output technique for high fault coverage in test-per-scan BIST

Abdallatif Abu Issa, Steven Quigley

Research output: Contribution to conference (unpublished)Paper

1 Citation (Scopus)
Original languageEnglish
Pages150-155
Number of pages6
DOIs
Publication statusPublished - 1 Jan 2008
Event2008 International Conference on Design & Technology of Integrated Systems in Nanoscale -
Duration: 1 Jan 2008 → …

Conference

Conference2008 International Conference on Design & Technology of Integrated Systems in Nanoscale
Period1/01/08 → …

Keywords

  • high fault coverage
  • built-in self-test
  • linear feedback shift register
  • test pattern generator
  • hard to detect faults

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