@conference{67adae4f23854ebd820460b2e597b2f6,
title = "A multi-output technique for high fault coverage in test-per-scan BIST",
keywords = "high fault coverage, built-in self-test, linear feedback shift register, test pattern generator, hard to detect faults",
author = "{Abu Issa}, Abdallatif and Steven Quigley",
year = "2008",
month = jan,
day = "1",
doi = "10.1109/DTIS.2008.4540236",
language = "English",
pages = "150--155",
note = "2008 International Conference on Design & Technology of Integrated Systems in Nanoscale ; Conference date: 01-01-2008",
}