A multi-output technique for high fault coverage in test-per-scan BIST

Research output: Contribution to conference (unpublished)Paper

Standard

A multi-output technique for high fault coverage in test-per-scan BIST. / Abu Issa, Abdallatif; Quigley, Steven.

2008. 150-155 Paper presented at 2008 International Conference on Design & Technology of Integrated Systems in Nanoscale, .

Research output: Contribution to conference (unpublished)Paper

Harvard

Abu Issa, A & Quigley, S 2008, 'A multi-output technique for high fault coverage in test-per-scan BIST', Paper presented at 2008 International Conference on Design & Technology of Integrated Systems in Nanoscale, 1/01/08 pp. 150-155. https://doi.org/10.1109/DTIS.2008.4540236

APA

Abu Issa, A., & Quigley, S. (2008). A multi-output technique for high fault coverage in test-per-scan BIST. 150-155. Paper presented at 2008 International Conference on Design & Technology of Integrated Systems in Nanoscale, . https://doi.org/10.1109/DTIS.2008.4540236

Vancouver

Abu Issa A, Quigley S. A multi-output technique for high fault coverage in test-per-scan BIST. 2008. Paper presented at 2008 International Conference on Design & Technology of Integrated Systems in Nanoscale, . https://doi.org/10.1109/DTIS.2008.4540236

Author

Abu Issa, Abdallatif ; Quigley, Steven. / A multi-output technique for high fault coverage in test-per-scan BIST. Paper presented at 2008 International Conference on Design & Technology of Integrated Systems in Nanoscale, .6 p.

Bibtex

@conference{67adae4f23854ebd820460b2e597b2f6,
title = "A multi-output technique for high fault coverage in test-per-scan BIST",
keywords = "high fault coverage, built-in self-test, linear feedback shift register, test pattern generator, hard to detect faults",
author = "{Abu Issa}, Abdallatif and Steven Quigley",
year = "2008",
month = jan
day = "1",
doi = "10.1109/DTIS.2008.4540236",
language = "English",
pages = "150--155",
note = "2008 International Conference on Design & Technology of Integrated Systems in Nanoscale ; Conference date: 01-01-2008",

}

RIS

TY - CONF

T1 - A multi-output technique for high fault coverage in test-per-scan BIST

AU - Abu Issa, Abdallatif

AU - Quigley, Steven

PY - 2008/1/1

Y1 - 2008/1/1

KW - high fault coverage

KW - built-in self-test

KW - linear feedback shift register

KW - test pattern generator

KW - hard to detect faults

U2 - 10.1109/DTIS.2008.4540236

DO - 10.1109/DTIS.2008.4540236

M3 - Paper

SP - 150

EP - 155

T2 - 2008 International Conference on Design & Technology of Integrated Systems in Nanoscale

Y2 - 1 January 2008

ER -