A multi-output technique for high fault coverage in test-per-scan BIST

Research output: Contribution to conference (unpublished)Paper

Authors

Colleges, School and Institutes

Details

Original languageEnglish
Pages150-155
Number of pages6
Publication statusPublished - 1 Jan 2008
Event2008 International Conference on Design & Technology of Integrated Systems in Nanoscale -
Duration: 1 Jan 2008 → …

Conference

Conference2008 International Conference on Design & Technology of Integrated Systems in Nanoscale
Period1/01/08 → …

Keywords

  • high fault coverage, built-in self-test, linear feedback shift register, test pattern generator, hard to detect faults