3D visualization and characterization of nano structured materials

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Standard

3D visualization and characterization of nano structured materials. / Ostadi, Hossein; Rama, Pratap; Chen, Rui; Liu, Y.; Zhang, Xiaoxian; Gao, Yuan; Jiang, Kyle.

2011 11th IEEE International Conference on Nanotechnology, NANO 2011. 2011. p. 770-775 6144402.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harvard

Ostadi, H, Rama, P, Chen, R, Liu, Y, Zhang, X, Gao, Y & Jiang, K 2011, 3D visualization and characterization of nano structured materials. in 2011 11th IEEE International Conference on Nanotechnology, NANO 2011., 6144402, pp. 770-775, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011, Portland, OR, United States, 15/08/11. https://doi.org/10.1109/NANO.2011.6144402

APA

Ostadi, H., Rama, P., Chen, R., Liu, Y., Zhang, X., Gao, Y., & Jiang, K. (2011). 3D visualization and characterization of nano structured materials. In 2011 11th IEEE International Conference on Nanotechnology, NANO 2011 (pp. 770-775). [6144402] https://doi.org/10.1109/NANO.2011.6144402

Vancouver

Ostadi H, Rama P, Chen R, Liu Y, Zhang X, Gao Y et al. 3D visualization and characterization of nano structured materials. In 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. 2011. p. 770-775. 6144402 https://doi.org/10.1109/NANO.2011.6144402

Author

Ostadi, Hossein ; Rama, Pratap ; Chen, Rui ; Liu, Y. ; Zhang, Xiaoxian ; Gao, Yuan ; Jiang, Kyle. / 3D visualization and characterization of nano structured materials. 2011 11th IEEE International Conference on Nanotechnology, NANO 2011. 2011. pp. 770-775

Bibtex

@inproceedings{3fff7b86ef7d4c0fa82712ec7b1f73fd,
title = "3D visualization and characterization of nano structured materials",
abstract = "This paper reports a study on 3D topography and tomography visualization of materials with micro and nano features. SEM stereo imaging technique is employed to characterize surfaces by reconstruction. With this technique, diatomaceous frustules and sputtering yield of metals were analyzed. X-ray nanotomography (nCT) is used for characterization of a polymer electrolyte fuel cell (PEFC) gas diffusion layer (GDL) with 680 nm resolution. Focused ion beam/SEM (FIB/SEM) nanotomography is developed to visualize materials with resolution from 8 to 60 nm. The technique was used to reconstruct glass micropipette tips and PEFC microporous layers (MPL). In addition, porosity of PEFC layers and roundness of micropipette tips can be extracted from the reconstructed models. As an example of the applications of the FIB/SEM technique, tomographic images of PEFC MPL is combined with the lattice Boltzmann (LB) numerical modeling to anticipate the permeability which helps understand the flow inside the porous layers of the fuel cell and provide the opportunity to improve the performance.",
author = "Hossein Ostadi and Pratap Rama and Rui Chen and Y. Liu and Xiaoxian Zhang and Yuan Gao and Kyle Jiang",
year = "2011",
month = dec,
day = "1",
doi = "10.1109/NANO.2011.6144402",
language = "English",
isbn = "9781457715143",
pages = "770--775",
booktitle = "2011 11th IEEE International Conference on Nanotechnology, NANO 2011",
note = "2011 11th IEEE International Conference on Nanotechnology, NANO 2011 ; Conference date: 15-08-2011 Through 19-08-2011",

}

RIS

TY - GEN

T1 - 3D visualization and characterization of nano structured materials

AU - Ostadi, Hossein

AU - Rama, Pratap

AU - Chen, Rui

AU - Liu, Y.

AU - Zhang, Xiaoxian

AU - Gao, Yuan

AU - Jiang, Kyle

PY - 2011/12/1

Y1 - 2011/12/1

N2 - This paper reports a study on 3D topography and tomography visualization of materials with micro and nano features. SEM stereo imaging technique is employed to characterize surfaces by reconstruction. With this technique, diatomaceous frustules and sputtering yield of metals were analyzed. X-ray nanotomography (nCT) is used for characterization of a polymer electrolyte fuel cell (PEFC) gas diffusion layer (GDL) with 680 nm resolution. Focused ion beam/SEM (FIB/SEM) nanotomography is developed to visualize materials with resolution from 8 to 60 nm. The technique was used to reconstruct glass micropipette tips and PEFC microporous layers (MPL). In addition, porosity of PEFC layers and roundness of micropipette tips can be extracted from the reconstructed models. As an example of the applications of the FIB/SEM technique, tomographic images of PEFC MPL is combined with the lattice Boltzmann (LB) numerical modeling to anticipate the permeability which helps understand the flow inside the porous layers of the fuel cell and provide the opportunity to improve the performance.

AB - This paper reports a study on 3D topography and tomography visualization of materials with micro and nano features. SEM stereo imaging technique is employed to characterize surfaces by reconstruction. With this technique, diatomaceous frustules and sputtering yield of metals were analyzed. X-ray nanotomography (nCT) is used for characterization of a polymer electrolyte fuel cell (PEFC) gas diffusion layer (GDL) with 680 nm resolution. Focused ion beam/SEM (FIB/SEM) nanotomography is developed to visualize materials with resolution from 8 to 60 nm. The technique was used to reconstruct glass micropipette tips and PEFC microporous layers (MPL). In addition, porosity of PEFC layers and roundness of micropipette tips can be extracted from the reconstructed models. As an example of the applications of the FIB/SEM technique, tomographic images of PEFC MPL is combined with the lattice Boltzmann (LB) numerical modeling to anticipate the permeability which helps understand the flow inside the porous layers of the fuel cell and provide the opportunity to improve the performance.

UR - http://www.scopus.com/inward/record.url?scp=84858973745&partnerID=8YFLogxK

U2 - 10.1109/NANO.2011.6144402

DO - 10.1109/NANO.2011.6144402

M3 - Conference contribution

AN - SCOPUS:84858973745

SN - 9781457715143

SP - 770

EP - 775

BT - 2011 11th IEEE International Conference on Nanotechnology, NANO 2011

T2 - 2011 11th IEEE International Conference on Nanotechnology, NANO 2011

Y2 - 15 August 2011 through 19 August 2011

ER -