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The effect of surface integrity of components processed by mu WEDM

  • A Rees
  • , Stefan Dimov
  • , R Minev
  • , G Lalev
  • , A Rosochowski
  • , L Olejnik

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication4m/Icomm 2009 - The Global Conference On Micro Manufacture, 1/01/09
Publication statusPublished - 1 Jan 2009

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