Abstract
Kernel embeddings of distributions and the Maximum Mean Discrepancy (MMD), the resulting distance between distributions, are useful tools for fully nonparametric two-sample testing and learning on distributions. However, it is rare that all possible differences between samples are of interest - discovered differences can be due to different types of measurement noise, data collection artefacts or other irrelevant sources of variability. We propose distances between distributions which encode invariance to additive symmetric noise, aimed at testing whether the assumed true underlying processes differ. Moreover, we construct invariant features of distributions, leading to learning algorithms robust to the impairment of the input distributions with symmetric additive noise.
Original language | English |
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Pages (from-to) | 1344-1354 |
Number of pages | 11 |
Journal | Advances in Neural Information Processing Systems |
Volume | 2017-December |
Publication status | Published - 1 Jan 2017 |
Event | 31st Annual Conference on Neural Information Processing Systems, NIPS 2017 - Long Beach, United States Duration: 4 Dec 2017 → 9 Dec 2017 |
ASJC Scopus subject areas
- Computer Networks and Communications
- Information Systems
- Signal Processing