TEM study of the deformation structures around nano-scratches

PC Wo, Ian Jones, AHW Ngan

Research output: Contribution to journalArticle

6 Citations (Scopus)


An in-plane transmission electron microscopy (TEM) investigation carried out on nano-scratches made in a Ni3Al foil revealed a high dislocation density within the scratch core, resulting in severe crystal rotations. The amount and sense of rotation were found to be asymmetrical about the longitudinal centre line of the scratch. Cross-sectional TEM analysis revealed that almost all the dislocations were confined within a semicircular zone having a radius similar to the calculated tip-sample contact size during scratching, in agreement with the in-plane TEM observations.
Original languageEnglish
Pages (from-to)1369-1388
Number of pages20
JournalPhilosophical Magazine
Issue number9
Publication statusPublished - 1 Jan 2008


  • TEM
  • dislocations
  • nano-scratch
  • focused ion-beam milling
  • nanoidentation


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