Suzuki segregation to stacking faults in a Cu-7.15 at% Si alloy

Research output: Contribution to conference (unpublished) › Paper

Original language	English
Pages	759-760
Number of pages	2
Publication status	Published - 1 Jan 2002
Event	15th International Congress on Electron Microscopy - Onderstepoort, S. Africa Duration: 1 Jan 2002 → …

Conference	15th International Congress on Electron Microscopy
City	Onderstepoort, S. Africa
Period	1/01/02 → …

Cite this

@conference{04c9aabd80824462ae84a2ca4d2842a0,

title = "Suzuki segregation to stacking faults in a Cu-7.15 at\% Si alloy",

author = "Budhika Mendis and Ian Jones and Raymond Smallman",

year = "2002",

month = jan,

day = "1",

language = "English",

pages = "759--760",

note = "15th International Congress on Electron Microscopy ; Conference date: 01-01-2002",

}