Suzuki segregation to stacking faults in a Cu-7.15 at% Si alloy

Budhika Mendis, Ian Jones, Raymond Smallman

Research output: Contribution to conference (unpublished)Paper

Original languageEnglish
Pages759-760
Number of pages2
Publication statusPublished - 1 Jan 2002
Event15th International Congress on Electron Microscopy - Onderstepoort, S. Africa
Duration: 1 Jan 2002 → …

Conference

Conference15th International Congress on Electron Microscopy
CityOnderstepoort, S. Africa
Period1/01/02 → …

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