Abstract
Porous silicon micro-particulates have been harvested after electrochemical anodization of lightly-doped p-type silicon wafers in hydrofluoric acid electrolyte containing sulfuric acid as an additive. Post-anodization, significantly higher internal surface areas per unit mass have been realized by utilizing super-critical drying with CO2 solvent instead of air-drying, with up to 1125 m2/g being achieved. Correspondingly higher pore volumes are also evident (>1 cm3/g) and, with average pore diameters ranging between 3–4 nm, a higher micropore content is made accessible. It is proposed that the improvements achieved through super-critical drying indicate that the higher density of micropores expected from the choice of wafer resistivity and electrolyte composition (their presence being confirmed through analysis of the adsorption-desorption isotherms) is facilitated through a higher degree of integrity being maintained within the etched pore structure during electrolyte removal.
Original language | English |
---|---|
Pages (from-to) | P289-P292 |
Number of pages | 4 |
Journal | ECS Journal of Solid State Science and Technology |
Volume | 4 |
Issue number | 8 |
DOIs | |
Publication status | Published - 28 May 2015 |