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Subcycle scanning near-field terahertz microscopy reaching atomic resolution
J. Hayes*, T. Siday, F. Schiegl, F. Sandner, P. Menden, V. Bergbauer, M. Zizlsperger, S. Nerreter, S. Lingl, J. Repp, J. Wilhelm, M. A. Huber, Y. A. Gerasimenko, R. Huber
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution