Subcycle optical microscopy with Angstrom-scale resolution

F. Schiegl; T. Siday; J. Hayes; P. Menden; V. Bergbauer; S. Nerreter; S. Lingl; J. Wilhelm; M. A. Huber; Y. A. Gerasimenko; R. Huber

doi:10.1117/12.3029407

Subcycle optical microscopy with Angstrom-scale resolution

F. Schiegl, T. Siday, J. Hayes, P. Menden, V. Bergbauer, S. Nerreter, S. Lingl, J. Wilhelm, M. A. Huber, Y. A. Gerasimenko, R. Huber

Physics and Astronomy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We introduce a novel contrast mechanism in near-field microscopy which allows for all-optical atomic-scale microscopy with subcycle temporal resolution. To this end, we combine near-field microscopy with ultrahigh vacuum, low temperatures and sub-nanometer tip tapping amplitudes. On these scales, a surprisingly efficient non-classical near-field response occurs, which follows the vector potential of light and is strictly confined to atomic length scales. This ultrafast signal features an optical phase delay of ~π/2 and facilitates tracking of tunnelling dynamics. Our method reveals nanoscale defects and captures current transients on semiconducting van-der-Waals materials with subcycle sampling, allowing us to record the quantum flow of electrons in conductive and insulating quantum materials at ultimate spatiotemporal scales.

Original language	English
Title of host publication	Terahertz Emitters, Receivers, and Applications XV
Editors	Manijeh Razeghi, Mona Jarrahi
Publisher	SPIE
Number of pages	3
ISBN (Electronic)	9781510679429
DOIs	https://doi.org/10.1117/12.3029407
Publication status	Published - 1 Oct 2024
Event	Terahertz Emitters, Receivers, and Applications XV 2024 - San Diego, United States Duration: 18 Aug 2024 → 19 Aug 2024

Publication series

Name	Proceedings of SPIE, the International Society for Optical Engineering
Publisher	SPIE
Volume	13141
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Terahertz Emitters, Receivers, and Applications XV 2024
Country/Territory	United States
City	San Diego
Period	18/08/24 → 19/08/24

Bibliographical note

Publisher Copyright:
© 2024 SPIE.

Keywords

all-optical microscopy
atomic resolution
near field microscopy
subcycle resolution
terahertz
ultrafast nanoscopy
van-der-Waals materials

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.3029407

Cite this

Schiegl, F., Siday, T., Hayes, J., Menden, P., Bergbauer, V., Nerreter, S., Lingl, S., Wilhelm, J., Huber, M. A., Gerasimenko, Y. A., & Huber, R. (2024). Subcycle optical microscopy with Angstrom-scale resolution. In M. Razeghi, & M. Jarrahi (Eds.), Terahertz Emitters, Receivers, and Applications XV Article 131410D (Proceedings of SPIE, the International Society for Optical Engineering; Vol. 13141). SPIE. https://doi.org/10.1117/12.3029407

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title = "Subcycle optical microscopy with Angstrom-scale resolution",

abstract = "We introduce a novel contrast mechanism in near-field microscopy which allows for all-optical atomic-scale microscopy with subcycle temporal resolution. To this end, we combine near-field microscopy with ultrahigh vacuum, low temperatures and sub-nanometer tip tapping amplitudes. On these scales, a surprisingly efficient non-classical near-field response occurs, which follows the vector potential of light and is strictly confined to atomic length scales. This ultrafast signal features an optical phase delay of ~π/2 and facilitates tracking of tunnelling dynamics. Our method reveals nanoscale defects and captures current transients on semiconducting van-der-Waals materials with subcycle sampling, allowing us to record the quantum flow of electrons in conductive and insulating quantum materials at ultimate spatiotemporal scales.",

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author = "F. Schiegl and T. Siday and J. Hayes and P. Menden and V. Bergbauer and S. Nerreter and S. Lingl and J. Wilhelm and Huber, {M. A.} and Gerasimenko, {Y. A.} and R. Huber",

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doi = "10.1117/12.3029407",

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Schiegl, F, Siday, T, Hayes, J, Menden, P, Bergbauer, V, Nerreter, S, Lingl, S, Wilhelm, J, Huber, MA, Gerasimenko, YA & Huber, R 2024, Subcycle optical microscopy with Angstrom-scale resolution. in M Razeghi & M Jarrahi (eds), Terahertz Emitters, Receivers, and Applications XV., 131410D, Proceedings of SPIE, the International Society for Optical Engineering, vol. 13141, SPIE, Terahertz Emitters, Receivers, and Applications XV 2024, San Diego, United States, 18/08/24. https://doi.org/10.1117/12.3029407

Subcycle optical microscopy with Angstrom-scale resolution. / Schiegl, F.; Siday, T.; Hayes, J. et al.
Terahertz Emitters, Receivers, and Applications XV. ed. / Manijeh Razeghi; Mona Jarrahi. SPIE, 2024. 131410D (Proceedings of SPIE, the International Society for Optical Engineering; Vol. 13141).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Subcycle optical microscopy with Angstrom-scale resolution

AU - Schiegl, F.

AU - Siday, T.

AU - Hayes, J.

AU - Menden, P.

AU - Bergbauer, V.

AU - Nerreter, S.

AU - Lingl, S.

AU - Wilhelm, J.

AU - Huber, M. A.

AU - Gerasimenko, Y. A.

AU - Huber, R.

PY - 2024/10/1

Y1 - 2024/10/1

N2 - We introduce a novel contrast mechanism in near-field microscopy which allows for all-optical atomic-scale microscopy with subcycle temporal resolution. To this end, we combine near-field microscopy with ultrahigh vacuum, low temperatures and sub-nanometer tip tapping amplitudes. On these scales, a surprisingly efficient non-classical near-field response occurs, which follows the vector potential of light and is strictly confined to atomic length scales. This ultrafast signal features an optical phase delay of ~π/2 and facilitates tracking of tunnelling dynamics. Our method reveals nanoscale defects and captures current transients on semiconducting van-der-Waals materials with subcycle sampling, allowing us to record the quantum flow of electrons in conductive and insulating quantum materials at ultimate spatiotemporal scales.

AB - We introduce a novel contrast mechanism in near-field microscopy which allows for all-optical atomic-scale microscopy with subcycle temporal resolution. To this end, we combine near-field microscopy with ultrahigh vacuum, low temperatures and sub-nanometer tip tapping amplitudes. On these scales, a surprisingly efficient non-classical near-field response occurs, which follows the vector potential of light and is strictly confined to atomic length scales. This ultrafast signal features an optical phase delay of ~π/2 and facilitates tracking of tunnelling dynamics. Our method reveals nanoscale defects and captures current transients on semiconducting van-der-Waals materials with subcycle sampling, allowing us to record the quantum flow of electrons in conductive and insulating quantum materials at ultimate spatiotemporal scales.

KW - all-optical microscopy

KW - atomic resolution

KW - near field microscopy

KW - subcycle resolution

KW - terahertz

KW - ultrafast nanoscopy

KW - van-der-Waals materials

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M3 - Conference contribution

AN - SCOPUS:85207637259

T3 - Proceedings of SPIE, the International Society for Optical Engineering

BT - Terahertz Emitters, Receivers, and Applications XV

A2 - Razeghi, Manijeh

A2 - Jarrahi, Mona

PB - SPIE

T2 - Terahertz Emitters, Receivers, and Applications XV 2024

Y2 - 18 August 2024 through 19 August 2024

ER -

Subcycle optical microscopy with Angstrom-scale resolution

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

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Cite this