Stray-field effects in submicron YBa2Cu3O7-x bicrystal grain boundary junctions

G Testa, F Laviano, DJ Kang, Edward Tarte, SH Mennema, MG Blamire

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@article{26cdde1bbd9944848674e21da84700ec,

title = "Stray-field effects in submicron YBa2Cu3O7-x bicrystal grain boundary junctions",

author = "G Testa and F Laviano and DJ Kang and Edward Tarte and SH Mennema and MG Blamire",

year = "2006",

month = jan,

day = "1",

doi = "10.1103/PhysRevB.73.014522",

language = "English",

volume = "73",

pages = "014522--1 to 041522--8",

journal = "Physical Review B",

issn = "1095-3795",

publisher = "American Physical Society (APS)",

number = "1",

}

TY - JOUR

T1 - Stray-field effects in submicron YBa2Cu3O7-x bicrystal grain boundary junctions

AU - Testa, G

AU - Laviano, F

AU - Kang, DJ

AU - Tarte, Edward

AU - Mennema, SH

AU - Blamire, MG

PY - 2006/1/1

Y1 - 2006/1/1

U2 - 10.1103/PhysRevB.73.014522

DO - 10.1103/PhysRevB.73.014522

M3 - Article

SN - 1095-3795

SN - 2469-9969

VL - 73

SP - 014522-1 to 041522-8

JO - Physical Review B

JF - Physical Review B

IS - 1

ER -