Keyphrases
70S30C
33%
Bone Scaffold
66%
Chemical Analysis
100%
Chemical Imaging
33%
Chemical Mapping
33%
Clear Image
33%
Depth Profile
33%
Electrospun Fibers
33%
Flat Surface
33%
Focused Ion Beam Technique
33%
High Spatial Resolution
33%
Highly Porous
100%
Image Region
33%
Mass Spectrometry Methods
33%
Periodic Table
33%
Pore Network
33%
Porous Bone Scaffold
100%
Porous Materials
33%
Region of Interest
66%
Scaffold Synthesis
33%
Secondary Ion Mass Spectrometry
100%
Silica
33%
Sol-gel
33%
Surface Sensitivity
33%
Three-dimensional (3D)
33%
Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS)
100%
Engineering
Critical Element
33%
Depth Profile
33%
Electrospun Fiber
33%
Flat Surface
33%
Focused Ion Beam
33%
Periodic Table
33%
Porosity
100%
Region of Interest
66%
Silicon Dioxide
33%
Spatial Resolution
33%
Time-of-Flight
100%
Chemistry
Imaging in Chemistry
33%
Ion Beam
33%
Porosity
100%
Secondary Ion Mass Spectroscopy
100%
Silicon
33%
Silicon Dioxide
33%
Time-of-Flight Secondary Ion Mass Spectrometry
100%
Material Science
Focused Ion Beam
16%
Secondary Ion Mass Spectrometry
100%
Silicon
16%
Silicon Dioxide
16%
Surface (Surface Science)
33%
Chemical Engineering
Secondary Ion Mass Spectrometry
100%