Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy

Tamara Monti; Ofonime Udoudo; Kevin Sperin; Chris Dodds; Timothy Jackson; Sam Kingman

doi:10.1109/TMTT.2016.2642940

Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy

Tamara Monti, Ofonime Udoudo, Kevin Sperin, Chris Dodds, Timothy Jackson, Sam Kingman

Electronic, Electrical and Systems Engineering

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Abstract

A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample were
performed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip

Original language	English
Pages (from-to)	2162-2170
Number of pages	9
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	65
Issue number	6
Early online date	19 Jan 2017
DOIs	https://doi.org/10.1109/TMTT.2016.2642940
Publication status	Published - Jun 2017

Bibliographical note

(c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works

Keywords

Dielectric constant
dielectric materials
Maxwell–Garnett approximation
microwave measurements
near-field measurements
nonhomogeneous media
scanning microwave microscope (SMM)
statistical distributions

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Monti_et_al_Statistical_description_of_inhomogenous_IEEEE_Transactions_on_Microwave_Theory_and_Techniques_2017
(c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works
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Cite this

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title = "Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy",

abstract = "A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample wereperformed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip",

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note = "(c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works",

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AU - Udoudo, Ofonime

AU - Sperin, Kevin

AU - Dodds, Chris

AU - Jackson, Timothy

AU - Kingman, Sam

N1 - (c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works

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N2 - A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample wereperformed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip

AB - A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample wereperformed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip

KW - Dielectric constant

KW - dielectric materials

KW - Maxwell–Garnett approximation

KW - microwave measurements

KW - near-field measurements

KW - nonhomogeneous media

KW - scanning microwave microscope (SMM)

KW - statistical distributions

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JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 6

ER -

Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy

Abstract

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Keywords

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