Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy

Tamara Monti, Ofonime Udoudo, Kevin Sperin, Chris Dodds, Timothy Jackson, Sam Kingman

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Abstract

A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample were
performed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip
Original languageEnglish
Pages (from-to)2162-2170
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Volume65
Issue number6
Early online date19 Jan 2017
DOIs
Publication statusPublished - Jun 2017

Keywords

  • Dielectric constant
  • dielectric materials
  • Maxwell–Garnett approximation
  • microwave measurements
  • near-field measurements
  • nonhomogeneous media
  • scanning microwave microscope (SMM)
  • statistical distributions

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