Resonant scattering probes for terahertz near-field microscopy

Tom Siday; Michele Natrella; Jiang Wu; Huiyun Liu; Oleg Mitrofanov

doi:10.1117/12.2290903

Resonant scattering probes for terahertz near-field microscopy

Tom Siday^*, Michele Natrella, Jiang Wu, Huiyun Liu, Oleg Mitrofanov

^*Corresponding author for this work

Physics and Astronomy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We propose and demonstrate a scattering-type near-field probe, designed to increase the sensitivity of high-resolution scattering probe microscopy at terahertz (THz) frequencies. For efficient scattering of THz radiation, the probe, fabricated from indium, is designed to resonate like a dipole antenna. Efficient excitation is achieved by integrating the probe with a radially-polarized THz source. Using time-domain spectroscopy (TDS), we observe resonant enhancement of the scattered fields, and using aperture-type near-field microscopy, we see high field confinement at the scattering probe apex.

Original language	English
Title of host publication	Quantum Sensing and Nano Electronics and Photonics XV
Editors	Giuseppe Leo, Gail J. Brown, Manijeh Razeghi, Jay S. Lewis
Publisher	SPIE
ISBN (Electronic)	9781510615656
DOIs	https://doi.org/10.1117/12.2290903
Publication status	Published - 2018
Event	Quantum Sensing and Nano Electronics and Photonics XV 2018 - San Francisco, United States Duration: 28 Jan 2018 → 2 Feb 2018

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	10540
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Quantum Sensing and Nano Electronics and Photonics XV 2018
Country/Territory	United States
City	San Francisco
Period	28/01/18 → 2/02/18

Bibliographical note

Publisher Copyright:
© 2018 SPIE.

Keywords

Near-field microscopy
Terahertz imaging

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2290903

Cite this

Siday, T., Natrella, M., Wu, J., Liu, H., & Mitrofanov, O. (2018). Resonant scattering probes for terahertz near-field microscopy. In G. Leo, G. J. Brown, M. Razeghi, & J. S. Lewis (Eds.), Quantum Sensing and Nano Electronics and Photonics XV Article 1054020 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10540). SPIE. https://doi.org/10.1117/12.2290903

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title = "Resonant scattering probes for terahertz near-field microscopy",

abstract = "We propose and demonstrate a scattering-type near-field probe, designed to increase the sensitivity of high-resolution scattering probe microscopy at terahertz (THz) frequencies. For efficient scattering of THz radiation, the probe, fabricated from indium, is designed to resonate like a dipole antenna. Efficient excitation is achieved by integrating the probe with a radially-polarized THz source. Using time-domain spectroscopy (TDS), we observe resonant enhancement of the scattered fields, and using aperture-type near-field microscopy, we see high field confinement at the scattering probe apex.",

keywords = "Near-field microscopy, Terahertz imaging",

author = "Tom Siday and Michele Natrella and Jiang Wu and Huiyun Liu and Oleg Mitrofanov",

note = "Publisher Copyright: {\textcopyright} 2018 SPIE.; Quantum Sensing and Nano Electronics and Photonics XV 2018 ; Conference date: 28-01-2018 Through 02-02-2018",

year = "2018",

doi = "10.1117/12.2290903",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

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Siday, T, Natrella, M, Wu, J, Liu, H & Mitrofanov, O 2018, Resonant scattering probes for terahertz near-field microscopy. in G Leo, GJ Brown, M Razeghi & JS Lewis (eds), Quantum Sensing and Nano Electronics and Photonics XV., 1054020, Proceedings of SPIE - The International Society for Optical Engineering, vol. 10540, SPIE, Quantum Sensing and Nano Electronics and Photonics XV 2018, San Francisco, United States, 28/01/18. https://doi.org/10.1117/12.2290903

Resonant scattering probes for terahertz near-field microscopy. / Siday, Tom; Natrella, Michele; Wu, Jiang et al.
Quantum Sensing and Nano Electronics and Photonics XV. ed. / Giuseppe Leo; Gail J. Brown; Manijeh Razeghi; Jay S. Lewis. SPIE, 2018. 1054020 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10540).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Resonant scattering probes for terahertz near-field microscopy

AU - Siday, Tom

AU - Natrella, Michele

AU - Wu, Jiang

AU - Liu, Huiyun

AU - Mitrofanov, Oleg

PY - 2018

Y1 - 2018

N2 - We propose and demonstrate a scattering-type near-field probe, designed to increase the sensitivity of high-resolution scattering probe microscopy at terahertz (THz) frequencies. For efficient scattering of THz radiation, the probe, fabricated from indium, is designed to resonate like a dipole antenna. Efficient excitation is achieved by integrating the probe with a radially-polarized THz source. Using time-domain spectroscopy (TDS), we observe resonant enhancement of the scattered fields, and using aperture-type near-field microscopy, we see high field confinement at the scattering probe apex.

AB - We propose and demonstrate a scattering-type near-field probe, designed to increase the sensitivity of high-resolution scattering probe microscopy at terahertz (THz) frequencies. For efficient scattering of THz radiation, the probe, fabricated from indium, is designed to resonate like a dipole antenna. Efficient excitation is achieved by integrating the probe with a radially-polarized THz source. Using time-domain spectroscopy (TDS), we observe resonant enhancement of the scattered fields, and using aperture-type near-field microscopy, we see high field confinement at the scattering probe apex.

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KW - Terahertz imaging

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DO - 10.1117/12.2290903

M3 - Conference contribution

AN - SCOPUS:85050180617

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Quantum Sensing and Nano Electronics and Photonics XV

A2 - Leo, Giuseppe

A2 - Brown, Gail J.

A2 - Razeghi, Manijeh

A2 - Lewis, Jay S.

PB - SPIE

T2 - Quantum Sensing and Nano Electronics and Photonics XV 2018

Y2 - 28 January 2018 through 2 February 2018

ER -

Resonant scattering probes for terahertz near-field microscopy

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this