Abstract
Nanoscale material systems are central to next-generation optoelectronic and quantum technologies, yet their development remains hindered by limited characterization tools, particularly at terahertz (THz) frequencies. Far-field THz spectroscopy techniques lack the sensitivity for investigating individual nanoscale systems, whereas in near-field THz nanoscopy, surface states, disorder, and sample-tip interactions often mask the response of the entire nanoscale system. Here, we present a THz resonance-amplified near-field spectroscopy technique that can detect subtle conductivity changes in isolated nanoscale systems─such as a single InAs nanowire─under ultrafast photoexcitation. By exploiting the spatial localization and resonant field enhancement in the gap of a bowtie antenna, our approach enables precise measurements of the nanostructures through shifts in the antenna resonant frequency, offering a direct means of extracting the system response, and unlocking investigations of ultrafast charge-carrier dynamics in isolated nanoscale and microscale systems.
| Original language | English |
|---|---|
| Pages (from-to) | 15716-15723 |
| Number of pages | 8 |
| Journal | Nano Letters |
| Volume | 24 |
| Issue number | 49 |
| Early online date | 26 Nov 2024 |
| DOIs | |
| Publication status | Published - 11 Dec 2024 |
Bibliographical note
Copyright:© 2024 The Authors. Published by American Chemical Society.
Keywords
- Nanowires
- Near-field microscopy
- Terahertz spectroscopy
- Ultrafast dynamics
ASJC Scopus subject areas
- Bioengineering
- General Chemistry
- General Materials Science
- Condensed Matter Physics
- Mechanical Engineering