Reliability Model for a Static Var Compensator

Manuel Alvarez Alvarado, Dilan Jayaweera

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)
412 Downloads (Pure)


This paper presents a reliability model of a Static Var Compensator (SVC) using an innovative algorithm based on sequential Monte Carlo simulation and Markov chains. The method employs the equivalent circuit of a SVC and takes the
failure rate and repair time of each component as input in order to compute the failure rate and repair time of the whole SVC system. The specific contribution of this investigation is that it presents a mathematical pathway to model operating conditions of a SVC subject to individual operating states of its components, resulting in a comprehensive reliability model.
Original languageEnglish
Title of host publication2017 IEEE Ecuador Technical Chapters Meeting (ETCM)
PublisherIEEE Xplore
ISBN (Electronic)9781509058105
Publication statusE-pub ahead of print - 8 Jan 2018
Event IEEE Ecuador Technical Chapter Meeting (IEEE ETCM 2017 ) - , Ecuador
Duration: 16 Oct 201720 Oct 2017


Conference IEEE Ecuador Technical Chapter Meeting (IEEE ETCM 2017 )


  • failure rate
  • Markov Chain
  • Monte Carlo simulation
  • reliability model
  • repair time
  • static var compensator


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