Realization and Properties of YBa₂Cu₃0₇₋δJosephson Junctions by Metal Masked Ion Damage Technique

D-J Kang; G Burnell; SJ Lloyd; RS Speaks; NH Peng; C Jeynes; R Webb; JH Yun; SH Moon; B Oh; Edward Tarte; DF Moore; MG Blamire

doi:10.1063/1.1446998

Realization and Properties of YBa₂Cu₃0₇₋δJosephson Junctions by Metal Masked Ion Damage Technique

D-J Kang, G Burnell, SJ Lloyd, RS Speaks, NH Peng, C Jeynes, R Webb, JH Yun, SH Moon, B Oh, Edward Tarte, DF Moore, MG Blamire

Electronic, Electrical and Systems Engineering

Research output: Contribution to journal › Article

27 Citations (Scopus)

Original language	English
Pages (from-to)	814
Number of pages	1
Journal	Applied Physics Letters
Volume	80
Issue number	5
DOIs	https://doi.org/10.1063/1.1446998
Publication status	Published - 1 Jan 2002

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10.1063/1.1446998

Cite this

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title = "Realization and Properties of YBa₂Cu₃0₇₋δJosephson Junctions by Metal Masked Ion Damage Technique",

author = "D-J Kang and G Burnell and SJ Lloyd and RS Speaks and NH Peng and C Jeynes and R Webb and JH Yun and SH Moon and B Oh and Edward Tarte and DF Moore and MG Blamire",

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AU - Kang, D-J

AU - Burnell, G

AU - Lloyd, SJ

AU - Speaks, RS

AU - Peng, NH

AU - Jeynes, C

AU - Webb, R

AU - Yun, JH

AU - Moon, SH

AU - Oh, B

AU - Tarte, Edward

AU - Moore, DF

AU - Blamire, MG

PY - 2002/1/1

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U2 - 10.1063/1.1446998

DO - 10.1063/1.1446998

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VL - 80

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JO - Applied Physics Letters

JF - Applied Physics Letters

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