Real-Time Microscopy of Two-Dimensional Critical Fluctuations: Disordering of the Si(113)-(3×1) Reconstruction

R. M. Tromp, W. Theis, N. C. Bartelt

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

Using low-energy electron microscopy, we have studied the critical fluctuations associated with the disordering of the (3 x 1) reconstruction on Si(113). We not only observe and quantify the increased spatial correlations near Tc, but also the associated slowing down of the relaxation of long wavelength critical fluctuations. The dependence of the slowing down on correlation length is consistent with theories for phase transitions with nonconserved order parameters. In addition, we show that steps limit the size of the correlation length, as is often conjectured.
Original languageEnglish
Pages (from-to)2522-2525
JournalPhysical Review Letters
Volume77
Issue number12
DOIs
Publication statusPublished - 16 Sep 1996

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