Preparation of an oriented FIB bed Ti-6Al-4V sample for in situ TEM observations of dislocation transmission through α/β interfaces

R. Dingi; I. P. Jones; Y. Chiu; J. Douin

Preparation of an oriented FIB bed Ti-6Al-4V sample for in situ TEM observations of dislocation transmission through α/β interfaces

R. Dingi, I. P. Jones, Y. Chiu, J. Douin

Metallurgy and Materials

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A novel method has been developed for preparing in situ straining samples for transmission electron microscopy (TEM) to study dislocation behaviour, here transmission through phase interfaces. A dual-beam focussed ion beam (FIB) microscope was used to extract an oriented foil from locations with specific crystallography in a sample which had been selected using electron backscattered diffraction (EBSD). The foil was attached to a pre-prepared substrate which was then strained in a TEM. The method has been demonstrated successfully by studying the 〈c+a〉 dislocation transmission through α/β interfaces in a commercial Ti-6Al-4V alloy.

Original language	English
Title of host publication	Ti 2011 - Proceedings of the 12th World Conference on Titanium
Pages	791-794
Number of pages	4
Volume	1
Publication status	Published - 1 Dec 2012
Event	12th World Conference on Titanium, Ti 2011 - Beijing, China Duration: 19 Jun 2011 → 24 Jun 2011

Conference

Conference	12th World Conference on Titanium, Ti 2011
Country/Territory	China
City	Beijing
Period	19/06/11 → 24/06/11

Keywords

Electron backscattered diffraction
Focused ion beam
In situ straining
Transmission electron microscopy

ASJC Scopus subject areas

Ceramics and Composites

Cite this

@inproceedings{e58ad7f8a849422f9d68af4433144006,

title = "Preparation of an oriented FIB bed Ti-6Al-4V sample for in situ TEM observations of dislocation transmission through α/β interfaces",

abstract = "A novel method has been developed for preparing in situ straining samples for transmission electron microscopy (TEM) to study dislocation behaviour, here transmission through phase interfaces. A dual-beam focussed ion beam (FIB) microscope was used to extract an oriented foil from locations with specific crystallography in a sample which had been selected using electron backscattered diffraction (EBSD). The foil was attached to a pre-prepared substrate which was then strained in a TEM. The method has been demonstrated successfully by studying the 〈c+a〉 dislocation transmission through α/β interfaces in a commercial Ti-6Al-4V alloy.",

keywords = "Electron backscattered diffraction, Focused ion beam, In situ straining, Transmission electron microscopy",

author = "R. Dingi and Jones, \{I. P.\} and Y. Chiu and J. Douin",

year = "2012",

month = dec,

day = "1",

language = "English",

isbn = "9787030338990",

volume = "1",

pages = "791--794",

booktitle = "Ti 2011 - Proceedings of the 12th World Conference on Titanium",

note = "12th World Conference on Titanium, Ti 2011 ; Conference date: 19-06-2011 Through 24-06-2011",

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TY - GEN

T1 - Preparation of an oriented FIB bed Ti-6Al-4V sample for in situ TEM observations of dislocation transmission through α/β interfaces

AU - Dingi, R.

AU - Jones, I. P.

AU - Chiu, Y.

AU - Douin, J.

PY - 2012/12/1

Y1 - 2012/12/1

N2 - A novel method has been developed for preparing in situ straining samples for transmission electron microscopy (TEM) to study dislocation behaviour, here transmission through phase interfaces. A dual-beam focussed ion beam (FIB) microscope was used to extract an oriented foil from locations with specific crystallography in a sample which had been selected using electron backscattered diffraction (EBSD). The foil was attached to a pre-prepared substrate which was then strained in a TEM. The method has been demonstrated successfully by studying the 〈c+a〉 dislocation transmission through α/β interfaces in a commercial Ti-6Al-4V alloy.

AB - A novel method has been developed for preparing in situ straining samples for transmission electron microscopy (TEM) to study dislocation behaviour, here transmission through phase interfaces. A dual-beam focussed ion beam (FIB) microscope was used to extract an oriented foil from locations with specific crystallography in a sample which had been selected using electron backscattered diffraction (EBSD). The foil was attached to a pre-prepared substrate which was then strained in a TEM. The method has been demonstrated successfully by studying the 〈c+a〉 dislocation transmission through α/β interfaces in a commercial Ti-6Al-4V alloy.

KW - Electron backscattered diffraction

KW - Focused ion beam

KW - In situ straining

KW - Transmission electron microscopy

UR - http://www.scopus.com/inward/record.url?scp=84883073162&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84883073162

SN - 9787030338990

VL - 1

SP - 791

EP - 794

BT - Ti 2011 - Proceedings of the 12th World Conference on Titanium

T2 - 12th World Conference on Titanium, Ti 2011

Y2 - 19 June 2011 through 24 June 2011

ER -

Preparation of an oriented FIB bed Ti-6Al-4V sample for in situ TEM observations of dislocation transmission through α/β interfaces

Abstract

Conference

Keywords

ASJC Scopus subject areas

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