Performance evaluation of an active pixel sensor test structure for space science applications

Helen Mapson-Menard, Christian Castelli, Christopher Eyles, ML Prydderch, NJ Waltham

Research output: Contribution to journalArticle

Abstract

An Active Pixel Sensor Test Structure, commissioned by the Rutherford Appleton Laboratory CCD Technology Group and designed by the Microelectronics Design Group, is being tested and evaluated by the University of Birmingham. The Test Structure includes four 16 x 16 pixel arrays, each array featuring a different 25 mum pixel design: Photogate, QuadruDot, n-type diffusion [Diode(ndps)] and p-type diffusion [Diode(pdNw)] photodiodes. Measurements are currently underway to characterize the Active Pixel Sensor performance. Initial measurements indicate pixel array gains of 2.9, 3.4, 38 and 50 electrons per ADC unit, for the QuadruDot, Photogate, Diode(ndps) and Diode(pdNw) arrays. The test-structure architecture, experimental set-up, results and conclusions are discussed, with reference to the performance benefits of this technology for future space applications. (C) 2003 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)313-316
Number of pages4
JournalNuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors
Volume513
Issue number1-2
DOIs
Publication statusPublished - 1 Nov 2003

Keywords

  • Active Pixel Sensor
  • CMOS

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