Abstract
Replacement of indium tin oxide with the intrinsically conducting polymer poly(3,4–ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) has been of significant interest in recent years as a result of lower processing and material costs. In addition, the inclusion of addi-tives has been reported to enhance the conductivity, rheology and wettability of PEDOT:PSS fur-ther. In this study, Tween 80 is shown to decrease the sheet resistance of PEDOT:PSS films from approximately 1000 to 76 Ω□-1 at a 2.67 wt% surfactant concentration. Through X-ray diffraction, Raman spectroscopy and atomic force microscopy, it is shown that the surfactant causes phase separation and structural ordering of the PEDOT and PSS components, leading to this improve-ment in conductivity. Furthermore, Tween 80 alters the rheological properties and decreases the surface tension of PEDOT:PSS, making coating onto common commodity polymers, often used as flexible substrates, more viable.
Original language | English |
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Article number | 5072 |
Number of pages | 14 |
Journal | Polymers |
Volume | 14 |
Issue number | 23 |
DOIs | |
Publication status | Published - 22 Nov 2022 |
Keywords
- PEDOT:PSS
- Tween 80
- sheet resistance
- microstructural analysis
- surface tension
- polymer thin films
- polymer blend films