Optimisation of patterned illumination to improve depth estimation from a plenoptic camera

Richard Marshall*, Christopher J. Meah, Massimo Turola, Steve Gruppetta, Ela Claridge, Nadine Meyer, Kai Bongs, Alex Robinson, Iain Styles

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

Depth maps of featureless planar scenes acquired using a plenoptic camera contain large errors. The accuracy of the depth estimation can be improved by projecting a random pattern onto the imaged plane.

Original languageEnglish
Title of host publicationImaging and Applied Optics 2015
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580002
DOIs
Publication statusPublished - 7 Jun 2015
EventImaging and Applied Optics 2015 - Arlington, United States
Duration: 7 Jun 201511 Jun 2015

Publication series

NameOSA Technical Digest
PublisherOptica Publishing Group

Conference

ConferenceImaging and Applied Optics 2015
Country/TerritoryUnited States
CityArlington
Period7/06/1511/06/15

Bibliographical note

Publisher Copyright:
© 2015 Optical Society of America.

Keywords

  • Three-dimensional image processing
  • Computational imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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