Barium strontium titanate (Ba0.05Sr0.95TiO3) ferroelectric thin films have been prepared on single crystal  MgO substrates using the pulsed laser deposition method. The X-ray diffraction (XRD) analysis show the films were oriented with the  direction perpendicular to the plane of the substrate. The refractive index of Ba0.05Sr0.95TiO3 is determined from model fitting with the calculated data of the reflectivity of Ba0.05Sr0.95TiO3 in the wavelength 1450-1580 nm at the room temperature. The dispersion curve decreases gradually with increasing wavelength. The average value of the refractive index is found to be 1.985 in the wavelength 1450-1580 nm which is important for optoelectronic device applications.
|Number of pages||6|
|Journal||Ferroelectrics Letters Section|
|Publication status||Published - 1 Sept 2007|
- thin films
- refractive index