Abstract
Barium strontium titanate (Ba0.05Sr0.95TiO3) ferroelectric thin films have been prepared on single crystal [001] MgO substrates using the pulsed laser deposition method. The X-ray diffraction (XRD) analysis show the films were oriented with the [001] direction perpendicular to the plane of the substrate. The refractive index of Ba0.05Sr0.95TiO3 is determined from model fitting with the calculated data of the reflectivity of Ba0.05Sr0.95TiO3 in the wavelength 1450-1580 nm at the room temperature. The dispersion curve decreases gradually with increasing wavelength. The average value of the refractive index is found to be 1.985 in the wavelength 1450-1580 nm which is important for optoelectronic device applications.
Original language | English |
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Pages (from-to) | 149-154 |
Number of pages | 6 |
Journal | Ferroelectrics Letters Section |
Volume | 34 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1 Sept 2007 |
Keywords
- thin films
- ferroelectrics
- refractive index