OOBKey: Key Exchange with Implantable Medical Devices Using Out-Of-Band Channels

Mo Zhang, Eduard Marin, Mark Ryan, Vassilis Kostakos, Toby Murray, Benjamin Tag, David Oswald

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Original language	English
Title of host publication	2024 21st Annual International Conference on Privacy, Security and Trust (PST)
Publisher	IEEE
Publication status	Accepted/In press - 4 Jun 2024

Name	Annual International Conference on Privacy, Security and Trust
Publisher	IEEE
ISSN (Print)	2574-139X
ISSN (Electronic)	2643-4202

Access to Document

@inproceedings{bde5e1027ce946fea87cb0b8f649260c,

title = "OOBKey: Key Exchange with Implantable Medical Devices Using Out-Of-Band Channels",

author = "Mo Zhang and Eduard Marin and Mark Ryan and Vassilis Kostakos and Toby Murray and Benjamin Tag and David Oswald",

year = "2024",

month = jun,

day = "4",

language = "English",

series = "Annual International Conference on Privacy, Security and Trust",

publisher = "IEEE",

booktitle = "2024 21st Annual International Conference on Privacy, Security and Trust (PST)",

}

OOBKey: Key Exchange with Implantable Medical Devices Using Out-Of-Band Channels. / Zhang, Mo; Marin, Eduard; Ryan, Mark et al.
2024 21st Annual International Conference on Privacy, Security and Trust (PST). IEEE, 2024. (Annual International Conference on Privacy, Security and Trust).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - OOBKey

T2 - Key Exchange with Implantable Medical Devices Using Out-Of-Band Channels

AU - Zhang, Mo

AU - Marin, Eduard

AU - Ryan, Mark

AU - Kostakos, Vassilis

AU - Murray, Toby

AU - Tag, Benjamin

AU - Oswald, David

PY - 2024/6/4

Y1 - 2024/6/4

UR - https://ieeexplore.ieee.org/xpl/conhome/1002478/all-proceedings

M3 - Conference contribution

T3 - Annual International Conference on Privacy, Security and Trust

BT - 2024 21st Annual International Conference on Privacy, Security and Trust (PST)

PB - IEEE

ER -