Abstract
Transmission electron microscopy has been used to reveal the microstructure of metastable C40 MOSi2 thin films produced by annealing amorphous magnetron-sputtered deposits at 700degreesC. The films contain nanoscale acicular grains elongated parallel to (0001), with extensive basal faulting. The faults are intrinsic with R = 13[0001] and correspond to thin slabs of the equilibrium C11(b) phase. It is proposed that these faults may act as nuclei for the subsequent transformation from C40 to C11(b) by a process akin to discontinuous coarsening.
Original language | English |
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Pages (from-to) | 687-694 |
Number of pages | 8 |
Journal | Philosophical Magazine Letters |
Volume | 82 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1 Dec 2002 |