TY - JOUR
T1 - Nanoscale defects and microwave properties of (BaSr)TiO3 ferroelectric thin films
AU - Jackson, T.J.
AU - Jones, I.P.
PY - 2009/10/1
Y1 - 2009/10/1
N2 - Thin film ferroelectrics may have important applications in microwave devices but in general have significantly worse properties than bulk material. This is principally because of secondary and point defects. The natures of the defects are reviewed and strategies to study and remove them outlined. © 2009 Springer Science+Business Media, LLC.
AB - Thin film ferroelectrics may have important applications in microwave devices but in general have significantly worse properties than bulk material. This is principally because of secondary and point defects. The natures of the defects are reviewed and strategies to study and remove them outlined. © 2009 Springer Science+Business Media, LLC.
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-68949187956&partnerID=8YFLogxK
U2 - 10.1007/s10853-009-3666-6
DO - 10.1007/s10853-009-3666-6
M3 - Article
SN - 1573-4803
VL - 44
SP - 5288
EP - 5296
JO - Journal of Materials Science
JF - Journal of Materials Science
IS - 19
ER -