Multilayer coated conductor test structures with high engineering current density

A study into the insulating layers for multi-layered coated conductors was undertaken in an effort to achieve high critical current density throughout the different layers of the structure. Single thin films of YBCO were grown, then covered with dielectric layers, onto single crystal and buffered, nickel, textured substrates using pulsed laser deposition. By using a combination of shadow masking and photolithography techniques, transport currents were measured through the layer to obtain its critical current density (J(c)). Additionally electron backscattered diffraction was employed to characterise the films. PrBa2Cu3O7-x was shown to maintain high Jc across the sample, thus maximising the overall engineering current density.