Modular thermal Hall effect measurement setup for fast-turnaround screening of materials over wide temperature range using capacitive thermometry

Ha-Leem Kim; Matthew John Coak; J. C. Baglo; Keiron Murphy; R. W. Hill; Michael Sutherland; M. Ciomaga Hatnean; Geetha Balakrishnan; Je-Geun Park

doi:10.1063/1.5108512

Modular thermal Hall effect measurement setup for fast-turnaround screening of materials over wide temperature range using capacitive thermometry

Ha-Leem Kim
, Matthew John Coak
, J. C. Baglo
, Keiron Murphy
, R. W. Hill
, Michael Sutherland
, M. Ciomaga Hatnean
, Geetha Balakrishnan
, Je-Geun Park

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	103904
Number of pages	1
Journal	Review of Scientific Instruments
Volume	90
Issue number	10
DOIs	https://doi.org/10.1063/1.5108512
Publication status	Published - 1 Oct 2019

Access to Document

10.1063/1.5108512

Cite this

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title = "Modular thermal Hall effect measurement setup for fast-turnaround screening of materials over wide temperature range using capacitive thermometry",

author = "Ha-Leem Kim and Coak, \{Matthew John\} and Baglo, \{J. C.\} and Keiron Murphy and Hill, \{R. W.\} and Michael Sutherland and Hatnean, \{M. Ciomaga\} and Geetha Balakrishnan and Je-Geun Park",

year = "2019",

month = oct,

day = "1",

doi = "10.1063/1.5108512",

language = "English",

volume = "90",

pages = "103904",

journal = "Review of Scientific Instruments",

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publisher = "American Institute of Physics",

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T1 - Modular thermal Hall effect measurement setup for fast-turnaround screening of materials over wide temperature range using capacitive thermometry

AU - Kim, Ha-Leem

AU - Coak, Matthew John

AU - Baglo, J. C.

AU - Murphy, Keiron

AU - Hill, R. W.

AU - Sutherland, Michael

AU - Hatnean, M. Ciomaga

AU - Balakrishnan, Geetha

AU - Park, Je-Geun

PY - 2019/10/1

Y1 - 2019/10/1

U2 - 10.1063/1.5108512

DO - 10.1063/1.5108512

M3 - Article

SN - 0034-6748

VL - 90

SP - 103904

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 10

ER -