Transmission electron microscopy has been used to characterise the microstructures of Sr2Cr0.5CuO2 precursor thin films and annealed Hg0.5Cr0.5Sr2CuO4+δ thin films on (0 0 1) SrTiO3 substrates. Precursor films consist essentially of amorphous Sr2CuO3 phase with SrCrxCuO2 grains embedded, while Hg0.5Cr0.5Sr2CuO4+δ films are epitaxial with the orientation relationship , . Hg and Cr diffuse through the whole film thickness. Some a-axis grains are present in the Hg0.5Cr0.5Sr2CuO4+δ films with much lower Hg and Cr contents.
|Number of pages||3|
|Journal||Physica C Superconductivity|
|Issue number||Part 2|
|Early online date||25 Apr 2002|
|Publication status||Published - 1 Aug 2002|
- thin film