Microstructure of superconducting Hg0.5Cr0.5Sr2CuO4+delta thin films on SrTiO3

Gaoning Kong, Ian Jones, John Abell, Martin Jones, Peter Edwards

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


Transmission electron microscopy has been used to characterise the microstructures of Sr2Cr0.5CuO2 precursor thin films and annealed Hg0.5Cr0.5Sr2CuO4+δ thin films on (0 0 1) SrTiO3 substrates. Precursor films consist essentially of amorphous Sr2CuO3 phase with SrCrxCuO2 grains embedded, while Hg0.5Cr0.5Sr2CuO4+δ films are epitaxial with the orientation relationship , . Hg and Cr diffuse through the whole film thickness. Some a-axis grains are present in the Hg0.5Cr0.5Sr2CuO4+δ films with much lower Hg and Cr contents.
Original languageEnglish
Pages (from-to)700-702
Number of pages3
JournalPhysica C Superconductivity
Issue numberPart 2
Early online date25 Apr 2002
Publication statusPublished - 1 Aug 2002


  • thin film
  • TEM
  • Hg0.5Cr0.5Sr2CuO4+delta
  • Sr2Cr0.5CuO2


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