Abstract
Transmission electron microscopy has been used to characterise the microstructures of Sr2Cr0.5CuO2 precursor thin films and annealed Hg0.5Cr0.5Sr2CuO4+δ thin films on (0 0 1) SrTiO3 substrates. Precursor films consist essentially of amorphous Sr2CuO3 phase with SrCrxCuO2 grains embedded, while Hg0.5Cr0.5Sr2CuO4+δ films are epitaxial with the orientation relationship , . Hg and Cr diffuse through the whole film thickness. Some a-axis grains are present in the Hg0.5Cr0.5Sr2CuO4+δ films with much lower Hg and Cr contents.
Original language | English |
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Pages (from-to) | 700-702 |
Number of pages | 3 |
Journal | Physica C Superconductivity |
Volume | 372-6 |
Issue number | Part 2 |
Early online date | 25 Apr 2002 |
DOIs | |
Publication status | Published - 1 Aug 2002 |
Keywords
- thin film
- TEM
- Hg0.5Cr0.5Sr2CuO4+delta
- Sr2Cr0.5CuO2