Abstract
A MOEMS system for 1-D focusing of X-rays has been fabricated using a thermal bimorph microcantilever to produce an element with variable focal length. A passive strain gauge is incorporated for feedback control of the zoom function. The focal length dependence on bimorph temperature has been measured. (c) 2007 Elsevier B.V. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 1252-1255 |
| Number of pages | 4 |
| Journal | Microelectronic Engineering |
| Volume | 84 |
| Issue number | 5-8 |
| DOIs | |
| Publication status | Published - 1 Jan 2007 |
Keywords
- X-ray focusing
- MOEMS
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