Measurement of probability distributions for internal stresses in dislocated crystals

Keyphrases

• Internal Stress 100%
• Probability Distribution 100%
• Misfit 33%
• High Stress 33%
• Functional Form 33%
• Histogram 33%
• Diffraction Measurements 33%
• Dislocation Density 33%
• Residual Stress Distribution 33%
• Second Moment 33%
• Sapphire 33%
• Stress Value 33%
• Face-centered Cubic 33%
• Body-centered Cubic 33%
• Large Strain 33%
• Cold Rolling 33%
• Severe Stress 33%
• Uniaxial Tension 33%
• Crystal System 33%
• High-resolution Electron Backscatter Diffraction 33%
• InAlN 33%
• Silicon Carbide Substrate 33%
• Stress Probability 33%
• X-ray Line Profile Analysis 33%

Engineering

• Internal Stress 100%
• Crystal Dislocation 100%
• High Resolution 50%
• Face-Centered Cubic 50%
• Stress Level 50%
• Histogram 50%
• Dislocation Density 50%
• Residual Stress Distribution 50%
• Body-Centered Cubic 50%
• Cold Rolling 50%
• Generality 50%
• Functional Form 50%
• Line Profile 50%