We describe measurements on microwave coplanar resonators designed for quantum bit experiments. Resonators have been patterned onto sapphire and silicon substrates, and quality factors in excess of a million have been observed. The resonant frequency shows a high sensitivity to magnetic field applied perpendicular to the plane of the film, with a quadratic dependence for the fundamental, second, and third harmonics. Frequency shift of hundreds of linewidths can be obtained with no change in the quality factor. (c) 2008 American Institute of Physics.