Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)

James Lawton; A Pulisciano; Richard Palmer

doi:10.1088/0953-8984/21/47/474206

Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)

James Lawton, A Pulisciano, Richard Palmer

Physics and Astronomy

Research output: Contribution to journal › Article

12 Citations (Scopus)

Abstract

Secondary-electron emission (SEE) spectra have been obtained with the Scanning Probe Energy Loss Spectrometer at a tip-sample distance of only 50 nm. Such short working distances are required for the best theoretical spatial resolution (

Original language	English
Pages (from-to)	474206
Number of pages	1
Journal	Journal of Physics: Condensed Matter
Volume	21
Issue number	47
DOIs	https://doi.org/10.1088/0953-8984/21/47/474206
Publication status	Published - 1 Nov 2009

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10.1088/0953-8984/21/47/474206

Scanning Probe Electron AnalyseR (SPEAR)
Palmer, R.
Engineering & Physical Science Research Council
1/01/07 → 30/06/10
Project: Research Councils

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title = "Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)",

abstract = "Secondary-electron emission (SEE) spectra have been obtained with the Scanning Probe Energy Loss Spectrometer at a tip-sample distance of only 50 nm. Such short working distances are required for the best theoretical spatial resolution (",

author = "James Lawton and A Pulisciano and Richard Palmer",

year = "2009",

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doi = "10.1088/0953-8984/21/47/474206",

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T1 - Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)

AU - Lawton, James

AU - Pulisciano, A

AU - Palmer, Richard

PY - 2009/11/1

Y1 - 2009/11/1

N2 - Secondary-electron emission (SEE) spectra have been obtained with the Scanning Probe Energy Loss Spectrometer at a tip-sample distance of only 50 nm. Such short working distances are required for the best theoretical spatial resolution (

AB - Secondary-electron emission (SEE) spectra have been obtained with the Scanning Probe Energy Loss Spectrometer at a tip-sample distance of only 50 nm. Such short working distances are required for the best theoretical spatial resolution (

U2 - 10.1088/0953-8984/21/47/474206

DO - 10.1088/0953-8984/21/47/474206

M3 - Article

SN - 1361-648X

VL - 21

SP - 474206

JO - Journal of Physics: Condensed Matter

JF - Journal of Physics: Condensed Matter

IS - 47

ER -

Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)

Abstract

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Projects

Scanning Probe Electron AnalyseR (SPEAR)

Cite this