Original language | English |
---|---|
Pages | 1325-1328 |
Number of pages | 4 |
DOIs | |
Publication status | Published - 1 Apr 2002 |
Keywords
- transmission electron microscopy
- permanent magnet
- convergent beam electron diffraction
G Yi, JN Chapman, DN Brown, Ivor Harris
Research output: Contribution to conference (unpublished) › Paper
Original language | English |
---|---|
Pages | 1325-1328 |
Number of pages | 4 |
DOIs | |
Publication status | Published - 1 Apr 2002 |