Integration of a scanning interferometer into a robotic inspection system for factory deployment

I. Biro, J. Turner, J. Hodgson, N. Lohse, P. Kinnell*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In order to comply with standards and increase product quality, modern high value manufacturing environments have an increasing need for flexible, productionline integrated inspection systems. These systems must not only be capable of covering large, free-form surfaces quickly, but they also need to support multiple sensors and have the ability to automatically identify areas of interest and inspect these locally, with high resolution. To address this issue, we have developed a flexible inspection system, using a laser line scanner, and an interferometer, mounted on an industrial robot arm, providing the ability to follow free-form surfaces following and easy production-line integration. The laser line scanner is used to inspect large areas quickly and with sufficient resolution to identify features of interest through a human observer or detection algorithms. These regions are then automatically revisited and measured in detail using the robot-mounted interferometer. The system integration is performed in a flexible, modular manner to allow easy extension with other sensors, as vision cameras or trackers. In this paper, we present the modular integration strategy, followed by showing key results from deploying this system and highlighting features and challenges resulting from the unconventional integration of an otherwise lab-based interferometer into a robot-mounted shopfloor system.

Original languageEnglish
Title of host publicationProceedings of the 2020 IEEE/SICE International Symposium on System Integration, SII 2020
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1371-1375
Number of pages5
ISBN (Electronic)9781728166674
DOIs
Publication statusPublished - Jan 2020
Event2020 IEEE/SICE International Symposium on System Integration, SII 2020 - Honolulu, United States
Duration: 12 Jan 202015 Jan 2020

Publication series

NameProceedings of the 2020 IEEE/SICE International Symposium on System Integration, SII 2020

Conference

Conference2020 IEEE/SICE International Symposium on System Integration, SII 2020
Country/TerritoryUnited States
CityHonolulu
Period12/01/2015/01/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Biomedical Engineering
  • Control and Systems Engineering
  • Safety, Risk, Reliability and Quality
  • Control and Optimization
  • Instrumentation

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