Abstract
The majority of electrical failures of wind turbines occur in the semiconductor devices of both grid and generator converters. This is due to the temperature swings caused by the variability of wind speed, which causes the progressive degradation of semiconductor devices. In order to increase reliability and decrease the operating costs, several condition monitoring methods have been proposed in the technical literature for the semiconductor devices used in WT converters. This paper comparatively reviews these methods and tries to give directions on the future steps that should be addressed by the research on this area.
| Original language | English |
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| Title of host publication | 5th IET International Conference on Renewable Power Generation (RPG) 2016 |
| Publisher | Institution of Engineering and Technology |
| ISBN (Electronic) | 978-1-78561-301-2 |
| ISBN (Print) | 978-1-78561-300-5 |
| DOIs | |
| Publication status | Published - 30 Jan 2017 |
| Event | 5th IET International Conference on Renewable Power Generation, RPG 2016 - London, United Kingdom Duration: 21 Sept 2016 → 23 Sept 2016 |
Publication series
| Name | IET International Conference on Renewable Power Generation (RPG) 2016 |
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Conference
| Conference | 5th IET International Conference on Renewable Power Generation, RPG 2016 |
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| Country/Territory | United Kingdom |
| City | London |
| Period | 21/09/16 → 23/09/16 |
Keywords
- Condition monitoring
- Fault detection
- Wind turbines
ASJC Scopus subject areas
- Electrical and Electronic Engineering