Imaging surfaces with reflected electrons from a field emission scanning tunnelling microscope: image contrast mechanisms

Frederic Festy; Krister Svensson; P Laitenberger; Richard Palmer

Imaging surfaces with reflected electrons from a field emission scanning tunnelling microscope: image contrast mechanisms

Frederic Festy
, Krister Svensson
, P Laitenberger
, Richard Palmer

Physics and Astronomy

Research output: Contribution to journal › Letter

13 Citations (Scopus)

Abstract

Electrons backscattered from a scanning tunnelling microscope operating in the field emission mode have been collected to produce images of a rough Si(1 1 1) surface. We have obtained a spatial resolution of about 40 nm in such images. Comparison between backscattered electron images and topographic images reveals that edge enhancement and shadowing are important contrast mechanisms.

Original language	English
Pages (from-to)	1849-1852
Number of pages	4
Journal	Journal of Physics D: Applied Physics
Volume	34
Publication status	Published - 1 Jan 2001

Cite this

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title = "Imaging surfaces with reflected electrons from a field emission scanning tunnelling microscope: image contrast mechanisms",

abstract = "Electrons backscattered from a scanning tunnelling microscope operating in the field emission mode have been collected to produce images of a rough Si(1 1 1) surface. We have obtained a spatial resolution of about 40 nm in such images. Comparison between backscattered electron images and topographic images reveals that edge enhancement and shadowing are important contrast mechanisms.",

author = "Frederic Festy and Krister Svensson and P Laitenberger and Richard Palmer",

year = "2001",

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journal = "Journal of Physics D: Applied Physics",

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T1 - Imaging surfaces with reflected electrons from a field emission scanning tunnelling microscope: image contrast mechanisms

AU - Festy, Frederic

AU - Svensson, Krister

AU - Laitenberger, P

AU - Palmer, Richard

PY - 2001/1/1

Y1 - 2001/1/1

N2 - Electrons backscattered from a scanning tunnelling microscope operating in the field emission mode have been collected to produce images of a rough Si(1 1 1) surface. We have obtained a spatial resolution of about 40 nm in such images. Comparison between backscattered electron images and topographic images reveals that edge enhancement and shadowing are important contrast mechanisms.

AB - Electrons backscattered from a scanning tunnelling microscope operating in the field emission mode have been collected to produce images of a rough Si(1 1 1) surface. We have obtained a spatial resolution of about 40 nm in such images. Comparison between backscattered electron images and topographic images reveals that edge enhancement and shadowing are important contrast mechanisms.

M3 - Letter

VL - 34

SP - 1849

EP - 1852

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

ER -

Imaging surfaces with reflected electrons from a field emission scanning tunnelling microscope: image contrast mechanisms

Abstract

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