Abstract
The limit imposed intrinsically by the diffraction of electromagnetic
waves has been extensively studied with the aim to improve the
performance of microscopy techniques and to obtain subwavelength
resolution. Several techniques have been proposed to solve this
disadvantage such as metamaterials and microspherical particles, to name
a few.
Original language | English |
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Title of host publication | Radio Science Meeting (Joint with AP-S Symposium), 2015 USNC-URSI |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 200 |
Number of pages | 1 |
DOIs | |
Publication status | Published - 2015 |