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High-carbon fullerene based spin-on organic hardmask

  • Guy Dawson
  • , Alan G. Brown
  • , Alexandra McClelland
  • , Tom Lada
  • , Warren Montgomery
  • , Alex P.G. Robinson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Irresistible Materials has previously introduced the HM340 series of fullerene based spin-on carbon, and reported on material characterization, including very high carbon content and high thermal stability. The materials have a low Ohnishi number providing high etch durability and the low hydrogen level allows for high-resolution etching without wiggling. Here we present further investigation of the spin-on-carbon, and demonstrate the flexibility of the platform. Film carbon content can be easily varied from as high as 95% (suitable for high durability etches) to as low as 80% (for instance to use as a sacrificial etch material). We present characterisation of the optical properties of the materials, and process and formulation developments. Work to vary the curing temperature between 200 and 300°C, and to reduce cure times to 90 seconds or less has been successfully undertaken. Alternative casting solvents have been investigated and work to achieve spin coatable film thickness ranges from less than 50 nm to significantly more than 500nm is described. and spin-coatable film thickness ranges from less than 50 nm to significantly more than 500nm are described. Results from initial planarisation trials are presented together with initial results from on-going work on spin-on carbon formulations that exceed 95% carbon content.

Original languageEnglish
Title of host publicationAdvances in Patterning Materials and Processes XXXV
EditorsChristoph K. Hohle
PublisherSociety of Photo-Optical Instrumentation Engineers
ISBN (Electronic)9781510616646
DOIs
Publication statusPublished - 2018
EventAdvances in Patterning Materials and Processes XXXV 2018 - San Jose, United States
Duration: 26 Feb 2018 → 1 Mar 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10586
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAdvances in Patterning Materials and Processes XXXV 2018
Country/TerritoryUnited States
CitySan Jose
Period26/02/18 → 1/03/18

Bibliographical note

Publisher Copyright:
© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

Keywords

  • Fullerene
  • ICP Silicon Etching
  • Organic Hard Mask
  • Spin-on Carbon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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