Abstract
Charged defects were found to have a significant influence over the microwave properties of Ba0.05Sr0.95TiO3 thin films.
| Original language | English |
|---|---|
| Pages (from-to) | 139-142 |
| Number of pages | 4 |
| Journal | Integrated Ferroelectrics |
| Volume | 61 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2004 |
Keywords
- microwave devices
- ferroelectric thin films
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