Fullerene Resist Materials for the 32 nm Node and Beyond

Francis Gibbons, Alexander Robinson, Richard Palmer, Sara Diegoli, Mayandithevar Manickam, Jon Preece

Research output: Contribution to journalArticle

24 Citations (Scopus)


Current resist materials cannot simultaneously meet the sensitivity, resolution and line width roughness (LWR) requirements set out by the International Technology Roadmap for Semiconductors (ITRS) for the 32nm node and beyond. Here we present a fullerene-based, chemically amplified resist system, which demonstrates the potential to fulfill these requirements for next generation lithography. A chemically amplified fullerene resist was prepared, consisting of the derivative MF07-01, an epoxide crosslinker, and a photoacid generator, such as triarylsulfonium hexafluoroantimonate. The sensitivity of this resist was shown to be between 5 and 10 mu C cm(-2) at 20 keV for various combinations of post-application bake and post-exposure bake conditions. Using 30 keV electron beam exposure, sparse patterns with 15 nm resolution were demonstrated, whilst for dense patterns a half-pitch of 25 nm could be achieved. The LWR for the densely patterned features is similar to 4 nm. The etch durability of the fullerene CA system was shown to be comparable to that of SAL601, a common novolac-based commercial resist, at almost four times that of silicon.
Original languageEnglish
Pages (from-to)1977-1982
Number of pages6
JournalAdvanced Functional Materials
Issue number13
Publication statusPublished - 9 Jul 2008


Dive into the research topics of 'Fullerene Resist Materials for the 32 nm Node and Beyond'. Together they form a unique fingerprint.

Cite this