Free-standing graphene by scanning transmission electron microscopy

FQ Song, Zi Li, Zhiwei Wang, L He, M Han, GH Wang

Research output: Contribution to journalArticle

13 Citations (Scopus)


Free-standing graphene sheets have been imaged by scanning transmission electron microscopy (STEM). We show that the discrete numbers of graphene layers enable an accurate calibration of STEM intensity to be performed over an extended thickness and with single atomic layer sensitivity. We have applied this calibration to carbon nanoparticles with complex structures. This leads to the direct and accurate measurement of the electron mean free path. Here, we demonstrate potentials using graphene sheets as a novel mass standard in STEM-based mass spectrometry. (C) 2010 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)1460-1464
Number of pages5
Issue number12
Publication statusPublished - 1 Nov 2010


  • Graphene
  • Scanning transmission electron microscopy
  • Carbon nanoparticles


Dive into the research topics of 'Free-standing graphene by scanning transmission electron microscopy'. Together they form a unique fingerprint.

Cite this