Free-standing graphene by scanning transmission electron microscopy

FQ Song, Zi Li, Zhiwei Wang, L He, M Han, GH Wang

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Free-standing graphene sheets have been imaged by scanning transmission electron microscopy (STEM). We show that the discrete numbers of graphene layers enable an accurate calibration of STEM intensity to be performed over an extended thickness and with single atomic layer sensitivity. We have applied this calibration to carbon nanoparticles with complex structures. This leads to the direct and accurate measurement of the electron mean free path. Here, we demonstrate potentials using graphene sheets as a novel mass standard in STEM-based mass spectrometry. (C) 2010 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)1460-1464
Number of pages5
JournalUltramicroscopy
Volume110
Issue number12
DOIs
Publication statusPublished - 1 Nov 2010

Keywords

  • Graphene
  • Scanning transmission electron microscopy
  • Carbon nanoparticles

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