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Abstract
Free-standing graphene sheets have been imaged by scanning transmission electron microscopy (STEM). We show that the discrete numbers of graphene layers enable an accurate calibration of STEM intensity to be performed over an extended thickness and with single atomic layer sensitivity. We have applied this calibration to carbon nanoparticles with complex structures. This leads to the direct and accurate measurement of the electron mean free path. Here, we demonstrate potentials using graphene sheets as a novel mass standard in STEM-based mass spectrometry. (C) 2010 Elsevier B.V. All rights reserved.
Original language | English |
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Pages (from-to) | 1460-1464 |
Number of pages | 5 |
Journal | Ultramicroscopy |
Volume | 110 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1 Nov 2010 |
Keywords
- Graphene
- Scanning transmission electron microscopy
- Carbon nanoparticles
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Dive into the research topics of 'Free-standing graphene by scanning transmission electron microscopy'. Together they form a unique fingerprint.Projects
- 1 Finished
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Towards an Atomic-scale understanding of the 3D Structures of size-selected Clusters on Surfaces
Li, Z., Johnston, R. & Palmer, R.
Engineering & Physical Science Research Council
1/02/10 → 17/01/14
Project: Research Councils