Abstract
P>Fractal geometry, developed by B. Mandelbrot, has provided new key concepts necessary to the understanding and quantification of some aspects of pattern and shape randomness, irregularity, complexity and self-similarity. In the field of microscopy, fractals have profound implications in relation to the effects of magnification and scaling on morphology and to the methodological approaches necessary to measure self-similar structures. In this article are reviewed the fundamental concepts on which fractal geometry is based, their relevance to the microscopy field as well as a number of technical details that can help improving the robustness of morphological analyses when applied to microscopy problems.
Original language | English |
---|---|
Pages (from-to) | 1-8 |
Number of pages | 8 |
Journal | Journal of Microscopy |
Volume | 241 |
Issue number | 1 |
Early online date | 10 Sept 2010 |
DOIs | |
Publication status | Published - 1 Jan 2011 |
Keywords
- morphology
- metrology
- irregularity
- Complexity
- randomness
- resolution
- fractal