Focused Ion Beam Milling and Imaging: An Advanced Method to Detect Fine Inclusions in Cast Aluminium Alloys

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4 Citations (Scopus)

Original language	English
Pages (from-to)	150-154
Journal	Materials Science Forum
Volume	765
DOIs	https://doi.org/10.4028/www.scientific.net/MSF.765.150
Publication status	Published - 2013

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title = "Focused Ion Beam Milling and Imaging: An Advanced Method to Detect Fine Inclusions in Cast Aluminium Alloys",

author = "KeeHyun Kim and N.R. Green and William Griffiths",

year = "2013",

doi = "10.4028/www.scientific.net/MSF.765.150",

language = "English",

volume = "765",

pages = "150--154",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Trans Tech Publications Inc",

}

TY - JOUR

T1 - Focused Ion Beam Milling and Imaging: An Advanced Method to Detect Fine Inclusions in Cast Aluminium Alloys

AU - Kim, KeeHyun

AU - Green, N.R.

AU - Griffiths, William

PY - 2013

Y1 - 2013

U2 - 10.4028/www.scientific.net/MSF.765.150

DO - 10.4028/www.scientific.net/MSF.765.150

M3 - Article

SN - 0255-5476

VL - 765

SP - 150

EP - 154

JO - Materials Science Forum

JF - Materials Science Forum

ER -